Scientific Publications
2021
(Accepted)
Horus: Non-Intrusive Causal Analysis of Distributed Systems Logs. Francisco Neves, Nuno Machado, Ricardo Vilaça, José Pereira. 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2021)
Totally-Ordered Prefix Parallel Snapshot Isolation. Nuno Faria, José Pereira. 8th Workshop on Principles and Practice of Consistency for Distributed Data (PaPoC @ EuroSys 2021)
Partially Monotonic Learning for Neural Networks. Joana Trindade, João Vinagre, Kelwin Fernandes, Nuno Paiva, Alípio Jorge. 19th International Symposium on Intelligent Data Analysis (IDA 2021)
Efficient Privacy Preserving Distributed K-Means for Non-IID Data. André Brandão, Ricardo Mendes, João P. Vilela. 19th International Symposium on Intelligent Data Analysis (IDA 2021)
Analysis of VM Migration Scheduling as Moving Target Defense against insider attacks. Torquato M, Maciel P, Vieira M. ACM/SIGAPP Symposium on Applied Computing (ACM SAC 2021)
2020
On the Use of Open-Source C/C++ Static AnalysisTools in Large Projects. Pereira JA, Vieira M. 16th European Dependable Computing Conference (EDCC 2020)
An Availability Model for DSS and OLTP Applications in Virtualized Environments. Torquato M, Gonçalves CF, Vieira M. 16th European Dependable Computing Conference (EDCC 2020)
Vulnerability Analysis as Trustworthiness Evidence in Security Benchmarking: A Case Study on Xen. Gonçalves C, Antunes N. 5th IEEE International Workshop on Reliability and Security Data Analysis (RSDA 2020) (co-located ISSRE 2020)
Fault Injection to Generate Failure Data for Failure Prediction: A Case Study. Campos J, Costa E. 31st International Symposium on Software Reliability Engineering (ISSRE 2020)
Using Attack Injection to Evaluate IntrusionDetection Effectiveness in Container-based Systems. Flora J, Gonçalves P, Antunes N. 25th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2020)
Vulnerable Code Detection Using Software Metrics and Machine Learning. Medeiros N, Ivaki N, Costa P, Vieira M. IEEE Access
