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Scientific Publications

2021

(Accepted)

Horus: Non-Intrusive Causal Analysis of Distributed Systems Logs. Francisco Neves, Nuno Machado, Ricardo Vilaça, José Pereira. 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2021)

Totally-Ordered Prefix Parallel Snapshot Isolation. Nuno Faria, José Pereira. 8th Workshop on Principles and Practice of Consistency for Distributed Data (PaPoC @ EuroSys 2021)

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Partially Monotonic Learning for Neural Networks. Joana Trindade, João Vinagre, Kelwin Fernandes, Nuno Paiva, Alípio Jorge. 19th International Symposium on Intelligent Data Analysis (IDA 2021)

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Efficient Privacy Preserving Distributed K-Means for Non-IID Data. André Brandão, Ricardo Mendes, João P. Vilela. 19th International Symposium on Intelligent Data Analysis (IDA 2021)

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Analysis of VM Migration Scheduling as Moving Target Defense against insider attacks. Torquato M, Maciel P, Vieira M. ACM/SIGAPP Symposium on Applied Computing (ACM SAC 2021)

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2020

On the Use of Open-Source C/C++ Static AnalysisTools in Large Projects. Pereira JA, Vieira M. 16th European Dependable Computing Conference (EDCC 2020)

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An Availability Model for DSS and OLTP Applications in Virtualized Environments. Torquato M, Gonçalves CF, Vieira M. 16th European Dependable Computing Conference (EDCC 2020)

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Vulnerability Analysis as Trustworthiness Evidence in Security Benchmarking: A Case Study on Xen. Gonçalves C, Antunes N. 5th IEEE International Workshop on Reliability and Security Data Analysis (RSDA 2020) (co-located ISSRE 2020)

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Fault Injection to Generate Failure Data for Failure Prediction: A Case Study. Campos J, Costa E. 31st International Symposium on Software Reliability Engineering (ISSRE 2020)

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Using Attack Injection to Evaluate IntrusionDetection Effectiveness in Container-based Systems. Flora J, Gonçalves P, Antunes N. 25th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2020)

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Vulnerable Code Detection Using Software Metrics and Machine Learning. Medeiros N, Ivaki N, Costa P, Vieira M. IEEE Access

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